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6H-SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval
Price for 16053 & 16053-20 includes a Hazardous Handling Fee
Daniel B Allred
671-300-CU - Ultrathin Carbon on Quantifoil®
Special Small Pin Stub, aluminum, grooved edge DEKTAK XTL 6H-SiC (0001) based calibration sampleDESCRIPTION Special Small Head 9. 6mm x 8mm pin height Special Small Pin Stub for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, Leica, CamScan), aluminum, grooved edge pkg 50
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