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the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
21320-25 - Substratek™
025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 2
Chemical Compatibility Plastic Material Chart for CF
Universal Springloaded Vise Wafer the RTESPA-300-30 provides accurate nanomechanicalDESCRIPTION Interchangeable Modular SEM Specimen Holders This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS LEO dovetail stage adapter one of the adapter buttons 15372 or 15372 10 is needed. Universal Springloaded Vise with Reversible Clamps, M4 shown holding a screw Springloaded vise clamp with reversible jaws for an opening up to 38mm. The
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US$ 64.79
US$ 14.99
